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Scanning electron microscope
Results: 580

#	Item
501	SCANNING ELECTRON MICROSCOPE FACILITY (SEMF) Network Project on Insect Biosystematics, Division of Entomology, Indian Agricultural Research Institute Add to Reading List Source URL: www.iari.res.in Language: English - Date: 2013-08-05 07:03:44 Electron microscope Scanning electron microscope Indian Agricultural Research Institute Fixation Sample Microscope Scientific method Electron microscopy Science
502	REPORT SECOND TEAM WORKSHOP MATERIALS RESEARCH IN AN ABERRATION-FREE ENVIRONMENT July[removed], 2002 Add to Reading List Source URL: ncem.lbl.gov Language: English - Date: 1970-04-13 20:14:13 Physics Microscopes Electron beam Laboratory techniques Transmission electron microscopy Electron microscope Electron Microscopy Scanning electron microscope Scientific method Electron microscopy Science
503 $Electron microscope / Transmission electron microscopy / Microscopy / Microscope / Electron diffraction / Tomography / Atom probe / Focused ion beam / Environmental scanning electron microscope / Scientific method / Electron microscopy / Science$	Microscopy Society of America DVD Library Number #1 Title/Presenter The Transmission Electron Microscope 29 minutes/ B&W Add to Reading List Source URL: www.microscopy.org Language: English - Date: 2012-07-06 09:52:16 Electron microscope Transmission electron microscopy Microscopy Microscope Electron diffraction Tomography Atom probe Focused ion beam Environmental scanning electron microscope Scientific method Electron microscopy Science
504	REPORT Third TEAM Workshop San Antonio, Texas August 8, 2003 Organizers: Christian Kisielowski Add to Reading List Source URL: ncem.lbl.gov Language: English - Date: 1970-04-13 07:15:03 Physics Transmission electron microscopy Electron microscope Microscope Electron Scanning electron microscope Microscopy Characterization Scanning transmission electron microscopy Scientific method Electron microscopy Science
505	Carbon Nanotube Material Quality Assessment Sivaram Arepalli 1, Edward Sosa 1, Pasha Nikolaev 1, William Holmes 1, Olga Gorelik 1, and Leonard Yowell 2 1 Add to Reading List Source URL: nanotube.msu.edu Language: English - Date: 2006-06-22 23:30:29 Chemistry Carbon nanotube Electron microscope Microscopy Atomic force microscopy Characterization Raman spectroscopy Scanning electron microscope Transmission electron microscopy Scientific method Science Electron microscopy
506	Microsoft Word - REPORT_FIG_2005.doc Add to Reading List Source URL: ncem.lbl.gov Language: English - Date: 1970-04-13 05:49:56 Physics Microscopes Electron beam Transmission electron microscopy Laboratory techniques Scanning transmission electron microscopy Electron microscope Electron tomography High-resolution transmission electron microscopy Electron microscopy Scientific method Science
507	CrN/Ag Coatings for Biomedical Implant Applications H. Li (PDRA, [removed]), A. Leyland, A. Matthews 1. Introduction There have been increasing numbers of biomedical implants used in the human body. Howev Add to Reading List Source URL: www.leonardocentre.co.uk Language: English - Date: 2013-01-10 11:01:40 Matter Materials science Semiconductor device fabrication Superhard materials Coating Titanium nitride Chromium nitride Electron beam physical vapor deposition Scanning electron microscope Chemistry Thin film deposition Nitrides
508	WORKSHOP REPORT ABERRATION CORRECTION IN ELECTRON MICROSCOPY MATERIALS RESEARCH IN AN ABERRATION-FREE ENVIRONMENT Add to Reading List Source URL: ncem.lbl.gov Language: English - Date: 1970-04-13 05:20:51 Microscopes Physics Electron microscope High-resolution transmission electron microscopy Transmission electron microscopy Scanning transmission electron microscopy Ondrej Krivanek Scanning electron microscope Contrast transfer function Scientific method Electron microscopy Science
509	Microsoft PowerPoint - REU Summer SEM Short Course[removed] Add to Reading List Source URL: www.reu.pdx.edu Language: English - Date: 2010-06-24 17:19:38 Microscopes Scanning electron microscope Electron microscope Everhart-Thornley detector Optical microscope Microscopy X-ray spectroscopy Electron microprobe Scanning transmission electron microscopy Scientific method Science Electron microscopy
510	SERVICES OVERVIEW ISO 9001, AS 9100, DLA MIL-PRF-38535, MIL-STD-883, ITAR registered and a DMEA Trusted Add to Reading List Source URL: www.integra-tech.com Language: English - Date: 2013-11-25 02:57:33 Semiconductor device fabrication Electron beam Scanning probe microscopy Failure analysis Maintenance Electron beam induced current Focused ion beam Scanning electron microscope MIL-STD-883 Scientific method Science Electron microscopy

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